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We can fabricate custom design Calibration Charts based on customer specification. These include Siemens Stars, Gratings, Slits, Slit pairs, Pinholes, Apertures, and Random Hole Arrays, which can be used as diffusers for Diffraction Imaging Experiments. Where necessary, the thickness of tungsten is carefully selected for phase shifting of the wave-
For absorption in High Energy X-
For Medium Energy X-
For Low Energy X-
For UV or LEEM/PEEM/Fluorescence samples, we use very thin layers (<50 nm) of a wide range of materials, such as Tungsten, Gold, Nickel, Germanium, Molybdenum, Niobium, Titanium, Si4N3, Silicon, Platinum, Lead etc...
Two examples of Custom Calibration Charts can be found here
We can use customer art work in simple Windows BMP file as a source for E-